Educating software engineering students to manage risk
Boehm, B.
Port, D.
Dept. of Comput. Sci., Univ. of Southern California, Los Angeles, CA;
This paper appears in: Software Engineering, 2001. ICSE 2001. Proceedings of the 23rd International Conference on
Publication Date: 2001
On page(s): 591-600
Meeting Date: 05/12/2001 - 05/19/2001
Location: Toronto, Ont., Canada
ISBN: 0-7695-1050-7
References Cited: 19
INSPEC Accession Number: 6931769
Digital Object Identifier: 10.1109/ICSE.2001.919133
Current Version Published: 2002-08-07
Abstract
In 1996, the University of Southern California (USC) switched its
core two-semester software engineering course from a
hypothetical-project, homework-and-exam course based on the Bloom
taxonomy of educational objectives (knowledge, comprehension,
application, analysis, synthesis and evaluation). The revised course is
a real-client team-project course based on the CRESST (Center for
Research on Evaluation, Standards and Student Testing) model of learning
objectives (content understanding, problem solving, collaboration,
communication and self-regulation). We used the CRESST cognitive demands
analysis to determine the necessary student skills required for software
risk management and the other major project activities, and have been
refining the approach over the last four years of experience, including
revised versions for one-semester undergraduate and graduate project
courses at Columbia University. This paper summarizes our experiences in
evolving the risk management aspects of the project courses. These have
helped us mature more general techniques, such as risk-driven
specifications, domain-specific simplifier and complicator lists, and
the SAIV (schedule as an independent variable) process model. The
largely positive results in terms of review pass/fail rates, client
evaluations, product adoption rates and hiring manager feedback are
summarized as well
Index
Terms
Available to subscribers and IEEE members.
References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
Cart
