Toward achieving energy efficiency in presence of deep submicronnoise
Hegde, R.
Shanbhag, N.R.
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL;
This paper appears in: Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publication Date: Aug 2000
Volume: 8,
Issue: 4
On page(s): 379-391
ISSN: 1063-8210
References Cited: 37
CODEN: IEVSE9
INSPEC Accession Number: 6707831
Digital Object Identifier: 10.1109/92.863617
Current Version Published: 2002-08-06
Abstract
Presented in this paper are: 1) information-theoretic lower bounds
on energy consumption of noisy digital gates and 2) the concept of noise
tolerance via coding for achieving energy efficiency in the presence of
noise. In particular, lower bounds on a) circuit speed fc and
supply voltage Vdd; b) transition activity t in presence of
noise; c) dynamic energy dissipation; and d) total (dynamic and static)
energy dissipation are derived. A surprising result is that in a
scenario where dynamic component of power dissipation dominates, the
supply voltage for minimum energy operation (Vdd, opt) is
greater than the minimum supply voltage (Vdd, min)for
reliable operation. We then propose noise tolerance via coding to
approach the lower bounds on energy dissipation. We show that the lower
bounds on energy for an off-chip I/O signaling example are a factor of
24× below present day systems. A very simple Hamming code can
reduce the energy consumption by a factor of 3×, while Reed-Muller
(RM) codes give a 4× reduction in energy dissipation
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