Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Hierarchical digital modulation classification using cumulants
Swami, A.   Sadler, B.M.  
Army Res. Lab., Adelphi, MD;

This paper appears in: Communications, IEEE Transactions on
Publication Date: Mar 2000
Volume: 48,  Issue: 3
On page(s): 416-429
ISSN: 0090-6778
References Cited: 32
CODEN: IECMBT
INSPEC Accession Number: 6562640
Digital Object Identifier: 10.1109/26.837045
Current Version Published: 2002-08-06

Abstract
A simple method, based on elementary fourth-order cumulants, is proposed for the classification of digital modulation schemes. These statistics are natural in this setting as they characterize the shape of the distribution of the noisy baseband I and Q samples. It is shown that cumulant-based classification is particularly effective when used in a hierarchical scheme, enabling separation into subclasses at low signal-to-noise ratio with small sample size. Thus, the method can be used as a preliminary classifier if desired. Computational complexity is order N, where N is the number of complex baseband data samples. This method is robust in the presence of carrier phase and frequency offsets and can be implemented recursively. Theoretical arguments are verified via extensive simulations and comparisons with existing approaches

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (380 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved