Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Retargetable estimation scheme for DSP architecture selection
Ghazal, N.   Newton, R.   Rabaey, J.  
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA;

This paper appears in: Design Automation Conference, 2000. Proceedings of the ASP-DAC 2000. Asia and South Pacific
Publication Date: 2000
On page(s): 485-489
Meeting Date: 01/25/2000 - 01/28/2000
Location: Yokohama, Japan
ISBN: 1-58113-187-9
References Cited: 15
INSPEC Accession Number: 6597051
Digital Object Identifier: 10.1109/ASPDAC.2000.835148
Current Version Published: 2002-08-06

Abstract
Given the recent wave of innovation and diversification in digital signal processor (DSP) architecture, the need for quickly evaluating the true potential of considered architectural choices for a given application has been rising. We propose a new scheme, called retargetable estimation, that involves analysis of a high-level description of a DSP application, with aggressive optimization search, to provide a performance estimate of its optimal implementation on the architectures considered. With this scheme, we present a new parameterized architecture model that allows quick retargeting to a wide range of architectural choices, and that emphasizes capturing an architecture's salient optimizing features. We show that for a set of DSP benchmarks and two full applications, hand-optimized performance can be predicted reliably. We applied this scheme to two different processors

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (452 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved