Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Is computer-based learning right for everyone?
Leuthold, J.H.  
Dept. of Econ., Illinois Univ., Urbana, IL;

This paper appears in: System Sciences, 1999. HICSS-32. Proceedings of the 32nd Annual Hawaii International Conference on
Publication Date: 1999
Volume: Track1,  On page(s): 8 pp.-
Meeting Date: 01/05/1999 - 01/08/1999
Location: Maui, HI, USA
ISBN: 0-7695-0001-3
References Cited: 11
INSPEC Accession Number: 6182019
Digital Object Identifier: 10.1109/HICSS.1999.772699
Current Version Published: 2002-08-06

Abstract
This study tests the hypothesis that a person's underlying learning style is a useful predictor of their attitude toward computer based instruction and learning. Students in the author's undergraduate economics class participated in a learning style assessment based on the Gregorc Learning Style Delineator to determine their basic learning style: concrete or abstract, sequential or random. Students were also surveyed as to their attitudes toward the computer based aspects of the class. Finally, correlation coefficients were computed to see whether or not certain learning styles were associated with positive attitudes toward computer instruction. According to the results, students with sequential learning styles use computer based instructional techniques more frequently and prefer them to traditional instructional techniques when compared with students whose learning styles are random

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (56 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved