Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Multichannel maximum-likelihood sequence estimation (MLSE)equalizer for GSM using a parametric channel model
Jiunn-Tsair Chen   Paulraj, A.   Reddy, U.  
Dept. of Electron. Eng., Nat. Taiwan Univ., Taipei ;

This paper appears in: Communications, IEEE Transactions on
Publication Date: Jan 1999
Volume: 47,  Issue: 1
On page(s): 53-63
ISSN: 0090-6778
References Cited: 28
CODEN: IECMBT
INSPEC Accession Number: 6185000
Digital Object Identifier: 10.1109/26.747813
Current Version Published: 2002-08-06

Abstract
We propose a novel algorithm for the maximum-likelihood sequence estimation (MLSE) equalizer for the Global System for Mobile Communications (GSM) system. Specifically, we use a parametric model for the channel, along with a modified phase pulse-shaping function of Gaussian minimum shift keying (GMSK) modulation to obtain the modified Viterbi equalizer which we refer to as the parametric channel-Viterbi equalizer (PC-VE). In contrast to the conventional Viterbi equalizer with a finite impulse response (FIR) channel description, the PC-VE avoids the linear approximation error. The PC-VE also has a lower computational complexity if the number of the propagation paths is less than the number of the FIR channel taps multiplied by the number of antennas. The proposed algorithm is applicable to both single and multiantenna receivers. An analytical expression for the BER as a function of the SNR, path delays, and path DOAs has been derived. Some simulation results that illustrate the performance of the proposed algorithm are presented

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (436 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved