Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

A support vector machine approach to decision trees
Bennett, K.P.   Blue, J.A.  
Rensselaer Polytech. Inst., Troy, NY;

This paper appears in: Neural Networks Proceedings, 1998. IEEE World Congress on Computational Intelligence. The 1998 IEEE International Joint Conference on
Publication Date: 4-9 May 1998
Volume: 3,  On page(s): 2396-2401 vol.3
Meeting Date: 05/04/1998 - 05/09/1998
Location: Anchorage, AK, USA
ISBN: 0-7803-4859-1
References Cited: 10
INSPEC Accession Number: 6047153
Digital Object Identifier: 10.1109/IJCNN.1998.687237
Current Version Published: 2002-08-06

Abstract
Key ideas from statistical learning theory and support vector machines are generalized to decision trees. A support vector machine is used for each decision in the tree. The “optimal” decision tree is characterized, and both a primal and dual space formulation for constructing the tree are proposed. The result is a method for generating logically simple decision trees with multivariate linear, nonlinear or linear decisions. By varying the kernel function used, the decisions may consist of linear threshold units, polynomials, sigmoidal neural networks, or radial basis function networks. The preliminary results indicate that the method produces simple trees that generalize well with respect to other decision tree algorithms and single support vector machines

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (440 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved