Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

30 years of adaptive neural networks: perceptron, Madaline, andbackpropagation
Widrow, B.   Lehr, M.A.  
Dept. of Electr. Eng., Stanford Univ., CA;

This paper appears in: Proceedings of the IEEE
Publication Date: Sep 1990
Volume: 78,  Issue: 9
On page(s): 1415-1442
ISSN: 0018-9219
References Cited: 133
CODEN: IEEPAD
INSPEC Accession Number: 3796897
Digital Object Identifier: 10.1109/5.58323
Current Version Published: 2002-08-06

Abstract
Fundamental developments in feedforward artificial neural networks from the past thirty years are reviewed. The history, origination, operating characteristics, and basic theory of several supervised neural-network training algorithms (including the perceptron rule, the least-mean-square algorithm, three Madaline rules, and the backpropagation technique) are described. The concept underlying these iterative adaptation algorithms is the minimal disturbance principle, which suggests that during training it is advisable to inject new information into a network in a manner that disturbs stored information to the smallest extent possible. The two principal kinds of online rules that have developed for altering the weights of a network are examined for both single-threshold elements and multielement networks. They are error-correction rules, which alter the weights of a network to correct error in the output response to the present input pattern, and gradient rules, which alter the weights of a network during each pattern presentation by gradient descent with the objective of reducing mean-square error (averaged over all training patterns)

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (2440 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved