Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Petri nets are monoids: a new algebraic foundation for net theory
Meseguer, J.   Montanari, U.  
SRI Int., Menlo Park, CA;

This paper appears in: Logic in Computer Science, 1988. LICS '88., Proceedings of the Third Annual Symposium on
Publication Date: 5-8 Jul 1988
On page(s): 155-164
Meeting Date: 07/05/1988 - 07/08/1988
Location: Edinburgh, UK
ISBN: 0-8186-0853-6
References Cited: 22
INSPEC Accession Number: 3248156
Digital Object Identifier: 10.1109/LICS.1988.5114
Current Version Published: 2002-08-06

Abstract
The composition and extraction mechanisms of Petri nets are at present inadequate. This problem is solved by viewing place/transition Petri nets as ordinary, directed graphs equipped with two algebraic operations corresponding to parallel and sequential composition of transitions. A distributive law between the two operations captures a basic fact about concurrency. Novel morphisms are defined, mapping single, atomic transitions into whole computations, thus relating system descriptions at different levels of abstraction. Categories equipped with products and coproducts (corresponding to parallel and nondeterministic compositions) are introduced for Petri nets with and without initial markings. It is briefly indicated how the approach yields function spaces and novel interpretations of duality and invariants. The results provide a formal basis for expressing the semantics of concurrent languages in terms of Petri nets and an understanding of concurrency in terms of algebraic structures over graphs and categories that should apply to other models and contribute to the conceptual unification of concurrency

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (836 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved