Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Assessment of post-cardiac-arrest somatosensory evoked potential in rats
Xiaoxu Kang   Koenig, M.   Orukari, I.   Geocadin, R.G.   Thakor, N.V.  

This paper appears in: Neural Engineering, 2009. NER '09. 4th International IEEE/EMBS Conference on
Publication Date: April 29 2009-May 2 2009
On page(s): 609-613
Location: Antalya,
ISBN: 978-1-4244-2072-8
INSPEC Accession Number: 10747244
Digital Object Identifier: 10.1109/NER.2009.5109370
Current Version Published: 2009-06-23

Abstract
Somatosensory evoked potential (SSEP) reflects the intactness of somatosensory pathways and is commonly used for brain function monitoring during surgeries. Conventional analysis of SSEP usually use sweep averaging, which requires long time recording and may distort the features (amplitudes, latencies) of SSEP components. Here we conducted single-trial SSEP analysis with wavelet denoising, and our results showed that wavelet denoising kept the information of SSEP components unchanged. Our analysis showed the amplitudes and latencies of N1/P1 all decreased compared the baseline level, indicating the neurological injuries in the somatosensory pathways. We hypothesized the neurological injuries in the thalamus may contribute to the decrease in amplitudes and latencies of SSEP components.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (574 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved