On-Die Power Supply Noise Measurement Techniques
Alon, E.
Abramzon, V.
Nezamfar, B.
Horowitz, M.
Dept. of Electr. Eng. & Comput. Sci., Univ. of California-Berkeley, Berkeley, CA;
This paper appears in: Advanced Packaging, IEEE Transactions on
Publication Date: May 2009
Volume: 32,
Issue: 2
On page(s): 248-259
ISSN: 1521-3323
INSPEC Accession Number: 10667167
Digital Object Identifier: 10.1109/TADVP.2009.2012521
First Published: 2009-05-08
Current Version Published: 2009-05-27
Abstract
This paper presents techniques for characterizing wide-band on-chip power supply noise using only two on-chip low-throughput samplers. The properties of supply noise and their associated measurement techniques are reviewed to show how this can be achieved. An initial design of the samplers uses high-resolution VCO-based analog-to-digital converters, and experimental results from a test-chip verify the efficacy of the measurement techniques. To enable simple sampler designs to be used even in aggressively scaled process technologies, measurement systems based on dithered low-resolution samplers are also developed and experimentally characterized.
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