Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Controlling diurnal rhythms by light
Ghosh, B.K.   Pakrasi, H.B.   Elvitigala, T.R.  
Dept. of Math. & Stat., Texas Tech Univ., Lubbock, TX;

This paper appears in: Control, Automation, Robotics and Vision, 2008. ICARCV 2008. 10th International Conference on
Publication Date: 17-20 Dec. 2008
On page(s): 1367-1372
Location: Hanoi,
ISBN: 978-1-4244-2286-9
INSPEC Accession Number: 10479533
Digital Object Identifier: 10.1109/ICARCV.2008.4795722
Current Version Published: 2009-02-27

Abstract
Life on earth is strongly affected by the day-night cycle, also known as the diurnal cycle. Due to its importance in survival, many organisms have developed an internal time keeping mechanism that goes by the name of circadian rhythm. Light plays a vital role for photosynthetic cyanobacteria and changes in the light pattern result in adaptive changes in the underlying biological processes at cellular level. Processes under circadian control are able to maintain their rhythm even under changes in the diurnal cycle, and it is important to isolate these processes from those whose rhythms are strongly affected by light. As the only known prokaryotic organism to have a robust circadian clock mechanism, cyanobacteria provide us with a unique opportunity to unveil the complex changes, especially changes in the process rhythms resulting from perturbation of the diurnal cycle. In this paper, we have identified the circadian controlled genes from those that are strongly influenced by light using a pair of genome wide study utilizing microarrays. A transcription model with an associated regulatory network is proposed.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (271 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved