Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Spectral trimming of fano reflectors on silicon and glass substrates
Hongjun Yang   Chuwongin, S.   Li Chen   Zexuan Qiang   Weidong Zhou   Huiqing Pang   Zhenqiang Ma  
Dept. of Electr. Eng., Univ. of Texas at Arlington, Arlington, TX;

This paper appears in: IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008. 21st Annual Meeting of the
Publication Date: 9-13 Nov. 2008
On page(s): 818-819
Location: Acapulco,
ISBN: 978-1-4244-1931-9
INSPEC Accession Number: 10409902
Digital Object Identifier: 10.1109/LEOS.2008.4688872
Current Version Published: 2008-11-25

Abstract
Surface-normal ultra-compact narrowband optical filters and broadband reflectors can all be realized via Fano resonances on patterned single layer silicon nanomembranes (SiNM) layers on SOI. Recently, we reported Fano filters transferred onto glass or flexible polyethylene terephthalate (PET) substrates, employing a low temperature wet-transfer process. Here we report demonstration of broadband reflectors based on Fano resonances, on SOI and on glass substrates, along with the spectral trimming for precise definition of cavity resonances, based on the effective index control of low index oxide layer surrounding patterned SiNM device layer.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (340 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved