Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Resource Constrained Stream Mining With Classifier Tree Topologies
Foo, B.   Turaga, D.S.   Verscheure, O.   van der Schaar, M.   Amini, L.  

This paper appears in: Signal Processing Letters, IEEE
Publication Date: 2008
Volume: 15,  On page(s): 761-764
ISSN: 1070-9908
INSPEC Accession Number: 10346031
Digital Object Identifier: 10.1109/LSP.2008.2001566
Current Version Published: 2008-11-18

Abstract
Stream mining applications require the identification of several different attributes in data content and hence rely on a distributed set of cascaded statistical classifiers to filter and process the data dynamically. In this letter, we introduce a novel methodology for configuring cascaded classifier topologies, specifically binary classifier trees, with optimized operating points after jointly considering the misclassification cost of each end-to-end class of interest in the tree, the resource constraints for every classifier, and the confidence level of each data object that is classified. By configuring multiple operating points per classifier, we enable not only intelligent load shedding when resources are scarce but also intelligent replication of low confidence data across multiple edges when excess resources are available. Using a classifier tree constructed from support vector machine-based sports image classifiers, we verify huge cost savings and discuss how different classifier placements and costs can influence the gains obtained by various algorithms.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (242 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved