Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

A novel shape analysis technique for somatosensory evoked potentials
Agrawal, Gracee   Sherman, David   Thakor, Nitish   All, Angelo  
Department of Biomedical Engineering, Johns Hopkins University, Baltimore, MD 21210 USA;

This paper appears in: Engineering in Medicine and Biology Society, 2008. EMBS 2008. 30th Annual International Conference of the IEEE
Publication Date: 20-25 Aug. 2008
On page(s): 4688-4691
Location: Vancouver, BC,
ISSN: 1557-170X
ISBN: 978-1-4244-1814-5
Digital Object Identifier: 10.1109/IEMBS.2008.4650259
Current Version Published: 2008-10-14

Abstract
Somatosensory evoked potentials (SEP) have been shown to be an important electrophysiological measure to assess the integrity of the spinal cord. However the peaks in the SEP waveform are often undetectable due to low signal-to-noise (SNR) ratio. Sometimes they also become indistinct during injury when the SEP flattens. Hence time-domain analysis methods are often subject to errors, and need human-expert intervention. In this paper, we propose a new technique for analyzing the shape of the evoked potentials, in which slope information is obtained for the entire signal in specific time bins. Apart from solving the problems associated with present methods, this technique has an added advantage of analyzing the SEP signal as a whole rather than simply a few peaks. The efficacy of this technique was investigated on SEP signals recorded from 12 rats before and after contusion spinal cord injury at thoracic vertebra T8. The statistical analysis results revealed significant effect of injury to hindlimbs, whereas almost none to forelimbs. Thus, the results show high potential of this technique to differentiate between normal and injured spinal cord.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (561 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved