Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

KPC-Toolbox: Simple Yet Effective Trace Fitting Using Markovian Arrival Processes
Casale, G.   Zhang, E.Z.   Smirni, E.  
Dept. of Comput. Sci., Coll. of William & Mary, Williamsburg, VA;

This paper appears in: Quantitative Evaluation of Systems, 2008. QEST '08. Fifth International Conference on
Publication Date: 14-17 Sept. 2008
On page(s): 83-92
Location: St. Malo,
ISBN: 978-0-7695-3360-5
INSPEC Accession Number: 10366425
Digital Object Identifier: 10.1109/QEST.2008.33
Current Version Published: 2008-09-26

Abstract
We present the KPC-Toolbox, a collection of MATLAB scripts for fitting workload traces into Markovian arrival processes (MAPs) in an automatic way. We first present detailed sensitivity analysis that builds intuition on which trace descriptors are most important for queueing. This sensitivity analysis stresses the importance of matching higher-order correlations (i.e., joint moments) of the process inter-arrival times rather than higher order moments of the distribution and provides guidance on the relative importance of different descriptors on queueing. Given that the MAP parameterization space can be very large, we focus on first determining the order of the smallest MAP that can fit the trace well, using the Bayesian information criterion (BIC) for determining the best order-accuracy tradeoff. Having determined the order of the target MAP, the KPC-Toolbox automatically derives a MAP that captures accurately the most essential features of the trace. Extensive experimentation illustrates the effectiveness of the KPC-Toolbox in fitting traces that are well-documented in the literature as very challenging to fit, showing that the KPC-Toolbox provides a simple and powerful solution to fitting accurately trace data into MAPs.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (354 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved