Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Conditional entropy of non-binary LDPC codes over the BEC
Rathi, V.  
Sch. of Comput. & Commun. Sci., EPFL, Zurich;

This paper appears in: Information Theory, 2008. ISIT 2008. IEEE International Symposium on
Publication Date: 6-11 July 2008
On page(s): 945-949
Location: Toronto, ON,
ISBN: 978-1-4244-2256-2
INSPEC Accession Number: 10156546
Digital Object Identifier: 10.1109/ISIT.2008.4595126
Current Version Published: 2008-08-08

Abstract
We consider transmission over the binary erasure channel (BEC) using non-binary LDPC codes. We generalize the concept of stopping sets to non-binary LDPC codes. We give a combinatorial characterization of decoding failures for non-binary LDPC codes decoded via Belief Propagation (BP). Using the density evolution analysis, we compute the asymptotic residual degree distribution for non-binary LDPC codes. In order to show that asymptotically almost every code in the non-binary LDPC ensemble has a rate equal to the design rate, we generalize the arguments of Measson, Montanari, and Urbanke to the non-binary setting. This generalization enables us to compute the conditional entropy of non-binary LDPC codes. We observe that the Maxwell construction of Measson, Montanari, and Urbanke relating the performance of MAP and BP decoding, holds in the setting of non-binary LDPC codes.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (219 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved