A Simulator of Small-Delay Faults Caused by Resistive-Open Defects
Czutro, A.
Houarche, N.
Engelke, P.
Polian, I.
Comte, M.
Renovell, M.
Becker, B.
Albert-Ludwigs-Univ., Freiburg;
This paper appears in: European Test, 2008 13th
Publication Date: 25-29 May 2008
On page(s): 113-118
Location: Verbania,
ISSN: 1530-1877
ISBN: 978-0-7695-3150-2
INSPEC Accession Number: 10066958
Digital Object Identifier: 10.1109/ETS.2008.19
Current Version Published: 2008-07-02
Abstract
We present a simulator which determines the coverage of small-delay faults, i.e., delay faults with a size below one clock cycle, caused by resistive-open defects. These defects are likely to escape detection by stuck-at or transition fault patterns. For the first time, we couple the calculation of the critical size of a small-delay fault with the computation of the resistance range of the corresponding resistive-open defect for which this size is exceeded. By doing so, we are able to extend probabilistic fault coverage metrics initially developed for static resistive bridging faults to small-delay defects.
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