Diagnosis of Realistic Defects Based on the X-Fault Model
Polian, I.
Miyase, K.
Nakamura, Y.
Kajihara, S.
Engelke, P.
Becker, B.
Spinner, S.
Xiaoqing Wen
Albert-Ludwigs-Univ., Freiburg;
Abstract
Defects not described by conventional fault models are a challenge for state-of-the-art fault diagnosis techniques. The X-fault model has been introduced recently as a modeling technique for complex defect mechanisms. We analyze the performance of the X-fault diagnosis for a number of defect classes leading to highly complex circuit behavior on electrical level. Experiments performed using accurate resistive- bridge and interconnect-open simulators demonstrate the superiority of X-fault diagnosis over traditional methods.
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