Reliability: Fallacy or Reality?
Gonzalez, A.
Mahlke, S.
Mukherjee, S.
Sendag, R.
Chiou, D.
Yi, J.J.
Univ. Polytech. de Catalunya, Barcelona;
This paper appears in: Micro, IEEE
Publication Date: Nov.-Dec. 2007
Volume: 27,
Issue: 6
On page(s): 36-45
ISSN: 0272-1732
INSPEC Accession Number: 9901209
Digital Object Identifier: 10.1109/MM.2007.107
Current Version Published: 2008-01-22
Abstract
As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability, following an introduction by the authors debate whether reliability is a legitimate concern for the microarchitect. topics include the costs of adding reliability versus those of ignoring it, how to measure it, techniques for improving it, and whether consumers really want it.
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