Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Multi-Bit Sigma Delta ADC with Reduced Feedback Levels, Extended Dynamic Range and Increased Tolerance for Analog Imperfections
Jian-Yi Wu   Subramoniam, R.   Zhenyong Zhang   Djabbari, A.   Holloway, P.   Maloberti, F.   Yousefi, M.   Asian, M.   Hua Hong   Bahai, A.  
Nat. Semicond., Santa Clara;

This paper appears in: Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Publication Date: 16-19 Sept. 2007
On page(s): 77-80
Location: San Jose, CA,
ISBN: 978-1-4244-1623-3
INSPEC Accession Number: 9803919
Digital Object Identifier: 10.1109/CICC.2007.4405685
Current Version Published: 2008-01-21

Abstract
A novel second order sigma delta modulator (SDM) with 5-bit quantizer has been proposed with simplified DAC arrays, high-order truncation noise shaping for increased tolerance to analog imperfections, and extended dynamic range for a maximum input signal swing of up to -0.45 dBFS. With truncation filter and pseudo SDM in the DSP, the truncation and saturation errors are compensated through the DAC arrays and the DSP. The design was fabricated in 0.18mu dual gate oxide (DGO) process. A SNDR (signal-to-noise-and-distortion ratio) of 98.4 dB and a SNR (signal-to-noise ratio) of 108-dB were measured for a 31.25-KHz signal bandwidth at 8-MHz sampling frequency with a power consumption of about 14.7 mW.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (3197 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved