Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Printed organic transistors for low-cost tagging and sensing applications
Subramanian, V.   Chang, J.   de la Fuente Vornbrock, A.   Molesa, S.   Soltman, D.   Qintao Zhang  
Univ. of California, Berkeley;

This paper appears in: Polymers and Adhesives in Microelectronics and Photonics, 2007. Polytronic 2007. 6th International Conference on
Publication Date: Jan. 16 2007-Yearly 18 2007
On page(s): 1-5
Location: Odaiba, Tokyo,
ISBN: 978-1-4244-1186-3
INSPEC Accession Number: 9682375
Digital Object Identifier: 10.1109/POLYTR.2007.4339126
Current Version Published: 2007-10-08

Abstract
Printing is considered an attractive technology for realizing electronic functionality at low cost. Inkjet printing, in particular is very attractive for applications requiring low material consumption and spatially-specific material deposition. We report on inkjet-printed transistors offering performance approaching that of amorphous silicon, fabricated using nanoparticle-based metallization and organic-based semiconductors and dielectrics. The performance of these devices is among the highest reported for fully-printed transistors. We explore the optimization of the various printing parameters to maximize device performance and film properties. We also demonstrate the use of organic devices in arrayed electronic nose gas sensors and biosensors, exploiting the unique spatially-specific material deposition capabilities offered by inkjet printing.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (3687 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved