Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

On Secure Distributed Source Coding
Prabhakaran, V.   Ramchandran, K.  
Univ. of California, Berkeley;

This paper appears in: Information Theory Workshop, 2007. ITW '07. IEEE
Publication Date: 2-6 Sept. 2007
On page(s): 442-447
Location: Tahoe City, CA,
ISBN: 1-4244-1564-0
INSPEC Accession Number: 9827102
Digital Object Identifier: 10.1109/ITW.2007.4313115
Current Version Published: 2007-09-24

Abstract
Exploiting correlated observations at multiple remote nodes for generating a secret common randomness to facilitate secure communication of data between the terminals has been addressed by many authors [1][2][3]. But in many applications such as sensor networks, the correlated observations might themselves be the data that need to be communicated. We address this problem of secure distributed source coding where we want to leak the least amount of information about the sources to an eavesdropper who may have access to a correlated observation of its own and who can listen in on the communication between the distributed encoders. The focus here is on minimizing the amount of information revealed to the eavesdropper rather than on minimizing the rate required to effect the communication.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (119 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved