Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Modelling and simulation techniques for highly integrated, low-power wireless sensor networks
Otis, B.   Gambini, S.   Shah, R.   Steingart, D.   Quevy, E.   Rabaey, J.   Sangiovanni-Vincentelli, A.   Wright, P.  
Univ. of Washington, Seattle;

This paper appears in: Computers & Digital Techniques, IET
Publication Date: Sept. 2007
Volume: 1,  Issue: 5
On page(s): 528-536
ISSN: 1751-8601
INSPEC Accession Number: 9944244
Digital Object Identifier: 10.1049/iet-cdt:20050214
Current Version Published: 2007-09-24

Abstract
The design of state-of-the-art low-power wireless sensor nodes involves the convergence of many technologies and disciplines. Submicron complementary metal oxide semiconductor (CMOS) devices, micro-electro-mechanical system filters, on- and off-chip electromagnetic elements, sensors and thin-film batteries are some of the technologies that will enable pervasive systems such as wireless sensor networks. High system complexity requires the use of many simulation environment during design: algorithm simulators, mechanical finite element analysis, behavioural and transistor-level circuit simulators, electromagnetic (EM) simulators, thin-film battery simulators and network simulators. It is shown that highly integrated, self-contained systems require multiple-domain simulations to uncover complex interactions between domains. Specific examples of block- and system-level design methodologies used in low-power wireless systems are presented here. Bottlenecks in the current methodology will be identified with an eye towards improving the scope and resolution of system-level simulations.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (607 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved