Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Analysis of Absorbing Sets for Array-Based LDPC Codes
Dolecek, L.   Zhengya Zhang   Anantharam, V.   Wainwright, M.   Nikolic, B.  
Univ. of California, Berkeley;

This paper appears in: Communications, 2007. ICC '07. IEEE International Conference on
Publication Date: 24-28 June 2007
On page(s): 6261-6268
Location: Glasgow,
ISBN: 1-4244-0353-7
INSPEC Accession Number: 9875723
Digital Object Identifier: 10.1109/ICC.2007.1037
Current Version Published: 2007-08-13

Abstract
Low density parity check codes (LDPC) are known to perform very well under iterative decoding. However, these codes also exhibit a change in the slope of the bit error rate (BER) vs. signal to noise ratio (SNR) curve in the very low BER region. In our earlier work using hardware emulation in this deep BER regime we argue that this behavior can be attributed to specific structures within the Tanner graph associated with an LDPC code, called absorbing sets. In this paper we provide a detailed theoretical analysis of absorbing sets for array-based LDPC codes Cp.gamma. Specifically, we identify and enumerate all the smallest absorbing sets for these array-based LDPC codes with gamma = 2,3,4 with standard parity check matrix. Experiments carried out on the emulation platform show excellent agreement with our theoretical results.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (311 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved