Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Compact Subnanosecond Pulse Generator Using Avalanche Transistors for Cell Electroperturbation Studies
Krishnaswamy, P.   Kuthi, A.   Vernier, P.T.   Gundersen, M.A.  
Univ. of Southern California, Los Angeles;

This paper appears in: Dielectrics and Electrical Insulation, IEEE Transactions on
Publication Date: Aug. 2007
Volume: 14,  Issue: 4
On page(s): 873-877
Location: Xi'an, China,
ISSN: 1070-9878
INSPEC Accession Number: 9606447
Digital Object Identifier: 10.1109/TDEI.2007.4286518
Current Version Published: 2007-08-08

Abstract
Research on the electroperturbation effects of ultrashort high field pulses in cancer cells requires subnanosecond rise time, high voltage pulses delivered to low impedance biological loads. Here we present a compact solid-state pulse generator developed for this application. The pulse is generated by switching a chain of avalanche transistors configured as a tapered transmission line from high voltage to ground. The system features a built in 1400:1 capacitively compensated resistive voltage divider. The divider, with a 3 dB point at 910 MHz, overcomes challenges in the direct measurement of the high frequency components of the output pulse. The generator is capable of producing a 0.8 ns rise time, 1.3 ns wide, 1.1 kV pulse into a 50 Omega load at a maximum repetition rate of 200 kHz. Techniques to implement physical layouting strategies to achieve subnanosecond rise times are outlined. Problems faced in integrating the subnanosecond pulse generator with a biological load are discussed. This pulse generator will be used in experiments aimed at electromanipulation of intracellular biomolecular structures.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (762 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved