Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

A Hardware Memory Race Recorder for Deterministic Replay
Xu, M.   Bodik, R.   Hill, M.D.  

This paper appears in: Micro, IEEE
Publication Date: Jan.-Feb. 2007
Volume: 27,  Issue: 1
On page(s): 48-55
ISSN: 0272-1732
INSPEC Accession Number: 9499096
Digital Object Identifier: 10.1109/MM.2007.2
Current Version Published: 2007-05-21

Abstract
As hardware vendors transition to multicore chips, software vendors face increased software reliability challenges. To effectively debug software in this new world, developers must be able to replay executions that exhibit a bug so that they can zero in on concurrency bugs - especially intermittent ones. Such deterministic replay also aids fault detection and recovery, intrusion detection, and the like. Deterministic replay requires both a recorder and a replayer. The recorder logs information during multithreaded program execution that is sufficient to enable deterministic replay. In the postmortem analysis, the replayer uses the logged information, together with the program binary, to faithfully replay the original execution. The replay will always exercise the same bugs and produce the same outputs. Clearly, an investment in modest chip resources has great potential to ease the challenges of debugging the multithreaded software that both users and vendors will continue to demand

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (316 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved