Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Intrinsic Limits of Dimensionality and Richness in Random Multipath Fields
Kennedy, R.A.   Sadeghi, P.   Abhayapala, T.D.   Jones, H.M.  
Res. Sch. of Inf. Sci. & Eng., Australian Nat. Univ., Canberra, ACT;

This paper appears in: Signal Processing, IEEE Transactions on
Publication Date: June 2007
Volume: 55,  Issue: 6, Part 1
On page(s): 2542-2556
ISSN: 1053-587X
INSPEC Accession Number: 9472271
Digital Object Identifier: 10.1109/TSP.2007.893738
Current Version Published: 2007-05-21

Abstract
We study the dimensions or degrees of freedom of farfield multipath that is observed in a limited, source-free region of space. The multipath fields are studied as solutions to the wave equation in an infinite-dimensional vector space. We prove two universal upper bounds on the truncation error of fixed and random multipath fields. A direct consequence of the derived bounds is that both fixed and random multipath fields have an effective finite dimension. For circular and spherical spatial regions, we show that this finite dimension is proportional to the radius and area of the region, respectively. We use the Karhunen-Loegraveve (KL) expansion of random multipath fields to quantify the notion of multipath richness. The multipath richness is defined as the number of significant eigenvalues in the KL expansion that achieve 99% of the total multipath energy. We establish a lower bound on the largest eigenvalue. This lower bound quantifies, to some extent, the well-known reduction of multipath richness with reducing the angular power spread of multipath angular power spectrum

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (690 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved