Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Computing Viable Sets and Reachable Sets to Design Feedback Linearizing Control Laws Under Saturation
Oishi, M.   Mitchell, I.   Tomlin, C.   Saint-Pierre, P.  
Dept. of Electr. & Comput. Eng., British Columbia Univ., Vancouver, BC;

This paper appears in: Decision and Control, 2006 45th IEEE Conference on
Publication Date: 13-15 Dec. 2006
On page(s): 3801-3807
Location: San Diego, CA,
ISBN: 1-4244-0171-2
INSPEC Accession Number: 9408915
Digital Object Identifier: 10.1109/CDC.2006.377614
Current Version Published: 2007-05-07

Abstract
We consider feedback linearizable systems subject to bounded control input and nonlinear state constraints. In a single computation, we synthesize 1) parameterized nonlinear controllers based on feedback linearization, and 2) the set of states over which this controller is valid. This is accomplished through a reachability calculation, in which the state is extended to incorporate input parameters. While we use a Hamilton-Jacobi formulation, a viability approach is also feasible. The result provides a mathematical guarantee that for all states within the computed set, there exists a control law that simultaneously satisfy two separate goals: envelope protection (no violation of state constraints), and stabilization despite saturation. We apply this technique to two real-world systems: the longitudinal dynamics of a civil jet aircraft, and a two-aircraft, planar collision avoidance scenario. The result, in both cases, is a feasible range of input parameters for the nonlinear control law, and a corresponding controlled invariant set

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (401 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved