Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Fast l/sub 1/ minimization for genomewide analysis of mRNA lengths
Drori, I.   Stodden, V.C.   Hurowitz, E.H.  
Dept. of Stat., Stanford Univ., Stanford, CA;

This paper appears in: Genomic Signal Processing and Statistics, 2006. GENSIPS '06. IEEE International Workshop on
Publication Date: 28-30 May 2006
On page(s): 19-20
Location: College Station, TX,
ISBN: 1-4244-0384-7
INSPEC Accession Number: 10284619
Digital Object Identifier: 10.1109/GENSIPS.2006.353135
Current Version Published: 2007-04-30

Abstract
Application of the virtual northern method to human mRNA allows us to systematically measure transcript length on a genome-wide scale [1]. Characterization of RNA transcripts by length provides a measurement which complements cDNA sequencing. We have robustly extracted the lengths of the transcripts expressed by each gene for comparison with the Unigene, Refseq, and H-Invitational databases [2, 3]. Obtaining an accurate probability for each peak requires performing multiple bootstrap simulations, each involving a deconvolution operation which is equivalent to finding the sparsest non-negative solution of an underdetermined system of equations. This process is computationally intensive for a large number of simulations and genes. In this contribution we present an efficient approximation method which is faster than general purpose solvers by two orders of magnitude, and in practice reduces our processing time from a week to hours.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (136 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved