Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Building a 3D Virtual Museum of Native American Baskets
Isler, V.   Wilson, B.   Bajcsy, R.  
Dept. of Comput. Sci., Rensselaer Polytech. Inst., Troy, NY;

This paper appears in: 3D Data Processing, Visualization, and Transmission, Third International Symposium on
Publication Date: 14-16 June 2006
On page(s): 954-961
Location: Chapel Hill, NC,
ISBN: 0-7695-2825-2
INSPEC Accession Number: 10285164
Digital Object Identifier: 10.1109/3DPVT.2006.38
Current Version Published: 2007-04-23

Abstract
In this paper we report our progress in building a system for the acquisition, analysis, and visualization of a collection of native Californian baskets from the Phoebe A. Hearst Museum of Anthropology. Our project differs from existing cultural heritage applications in terms of its focus: to build tools and techniques for visualizing and studying a large number of related objects - in this case, baskets. We present our progress in the following system components: (i) laser-scanning of baskets, (ii) construction and processing of 3D models, and (iii) building virtual exhibits. We conclude the paper with our experiences and a summary of challenges we anticipate in building a completely automated system for processing and analyzing a large set of models - such as might be encountered when digitizing a large museum collection. Efficient retrieval and visualization of artifact collections are important to a number of communities, including anthropology researchers, Native American tribes, and the general public.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1756 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved