Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

A Quadratic Modeling-Based Framework for Accurate Statistical Timing Analysis Considering Correlations
Khandelwal, V.   Srivastava, A.  
Dept. of Electr. & Comput. Eng., Maryland Univ., College Park, MD;

This paper appears in: Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publication Date: Feb. 2007
Volume: 15,  Issue: 2
On page(s): 206-215
Location: San Francisco, CA, USA,
ISSN: 1063-8210
INSPEC Accession Number: 9396516
Digital Object Identifier: 10.1109/TVLSI.2007.893585
Current Version Published: 2007-04-02

Abstract
The impact of parameter variations on timing due to process variations has become significant in recent years. In this paper, we present a statistical timing analysis (STA) framework with quadratic gate delay models that also captures spatial correlations. Our technique does not make any assumption about the distribution of the parameter variations, gate delays, and arrival times. We propose a Taylor-series expansion-based quadratic representation of gate delays and arrival times which are able to effectively capture the nonlinear dependencies that arise due to increasing parameter variations. In order to reduce the computational complexity introduced due to quadratic modeling during STA, we also propose an efficient linear modeling driven quadratic STA scheme. We ran two sets of experiments assuming the global parameters to have uniform and Gaussian distributions, respectively. On an average, the quadratic STA scheme had 20.5times speedup in runtime as compared to Monte Carlo simulations with an rms error of 0.00135 units between the two timing cummulative density functions (CDFs). The linear modeling driven quadratic STA scheme had 51.5times speedup in runtime as compared to Monte Carlo simulations with an rms error of 0.0015 units between the two CDFs. Our proposed technique is generic and can be applied to arbitrary variations in the underlying parameters under any spatial correlation model

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (521 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved