Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Power and Area Minimization for Multidimensional Signal Processing
Markovic, D.   Nikolic, B.   Brodersen, R.W.  
Dept. of Electr. Eng., California Univ., Los Angeles, CA;

This paper appears in: Solid-State Circuits, IEEE Journal of
Publication Date: April 2007
Volume: 42,  Issue: 4
On page(s): 922-934
Location: Lille, France,
ISSN: 0018-9200
INSPEC Accession Number: 9381841
Digital Object Identifier: 10.1109/JSSC.2007.892191
Current Version Published: 2007-03-26

Abstract
Sensitivity-based methodology is applied to optimization of performance, power and area across several levels of design abstraction for a complex wireless baseband signal processing algorithm. The design framework is based on a unified, block-based graphical description of the algorithm to avoid design re-entry in various phases of chip development. The use of architectural techniques for minimization of power and area for complex signal processing algorithms is demonstrated using this framework. As a proof of concept, an ASIC realization of the MIMO baseband signal processing for a multi-antenna WLAN is described. The chip implements a 4times4 adaptive singular value decomposition (SVD) algorithm with combined power and area minimization achieving a power efficiency of 2.1 GOPS/mW (12-bit add equivalent) in just 3.5 mm 2 in a standard 90 nm CMOS process. The computational throughput of 70 GOPS is implemented with 0.5 M cells at a 100 MHz clock and 385 mV supply, dissipating 34 mW of power. With optimal channel conditions the algorithm implemented can deliver up to 250 Mb/s over 16 sub-carriers

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (2177 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved