Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Rigorous Analytical/Graphical Injection Locking Analysis of Two-Port Negative Resistance Oscillators
Ting Mei   Roychowdhury, J.  
Minnesota Univ., Twin Cities, MN;

This paper appears in: Custom Integrated Circuits Conference, 2006. CICC '06. IEEE
Publication Date: 10-13 Sept. 2006
On page(s): 741-744
Location: San Jose, CA,
ISBN: 1-4244-0075-9
INSPEC Accession Number: 9464662
Digital Object Identifier: 10.1109/CICC.2006.320965
Current Version Published: 2007-02-26

Abstract
In this paper, the authors present a simple but rigorous nonlinear analysis for understanding and predicting steady-state operation and injection locking in two-port nonlinear negative-resistance oscillators (such as the Colpitts, Pierce, etc., topologies commonly used in RFICs). Key advances of our approach include the use of vector-based nonlinear feedback analysis and treatment of amplitude and frequency components in a coupled way. The authors develop rigorous and insightful graphical approaches for output voltage estimation and injection lock range prediction. The authors validate the analytical approach against transient and harmonic balance simulations

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (553 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved