Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Channel Coherence in the Low-SNR Regime
Lizhong Zheng   David N. C. Tse   Muriel Medard  
Massachusetts Inst. of Technol., Cambridge, MA;

This paper appears in: Information Theory, IEEE Transactions on
Publication Date: March 2007
Volume: 53,  Issue: 3
On page(s): 976-997
ISSN: 0018-9448
INSPEC Accession Number: 9313689
Digital Object Identifier: 10.1109/TIT.2006.890777
Current Version Published: 2007-02-20

Abstract
Channel capacity in the limit of vanishing signal-to-noise ratio (SNR) per degree of freedom is known to be linear in SNR for fading and nonfading channels, regardless of channel state information at the receiver (CSIR). It has recently been shown that the significant engineering difference between the coherent and the noncoherent fading channels, including the requirement of peaky signaling and the resulting spectral efficiency, is determined by how the capacity limit is approached as SNR tends to zero, or in other words, the sublinear term in the capacity expression. In this paper, we show that this sublinear term is determined by the channel coherence level, which we define to quantify the relation between the SNR and the channel coherence time. This allows us to trace a continuum between the case with perfect CSIR and the case with no CSIR at all. Using this approach, we also evaluate the performance of suboptimal training schemes

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (657 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved