Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Detecting Distributed Scans Using High-Performance Query-Driven Visualization
Kurt Stockinger   E. Wes Bethel1   Scott Campbell   Eli Dart   Kesheng Wu  
Computational Res. Div., Univ. of California, Berkeley, CA;

This paper appears in: SC 2006 Conference, Proceedings of the ACM/IEEE
Publication Date: Nov. 2006
On page(s): 39-39
Location: Tampa, FL,
ISBN: 0-7695-2700-0
INSPEC Accession Number: 9353245
Digital Object Identifier: 10.1109/SC.2006.25
Current Version Published: 2007-02-12

Abstract
Modern forensic analytics applications, like network traffic analysis, perform high-performance hypothesis testing, knowledge discovery and data mining on very large datasets. One essential strategy to reduce the time required for these operations is to select only the most relevant data records for a given computation. In this paper, we present a set of parallel algorithms that demonstrate how an efficient selection mechanism - bitmap indexing - significantly speeds up a common analysis task, namely, computing conditional histogram on very large datasets. We present a thorough study of the performance characteristics of the parallel conditional histogram algorithms. As a case study, we compute conditional histograms for detecting distributed scans hidden in a dataset consisting of approximately 2.5 billion network connection records. We show that these conditional histograms can be computed on interactive time scale (i.e., in seconds). We also show how to progressively modify the selection criteria to narrow the analysis and find the sources of the distributed scans

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (686 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved