Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Improvements to Technology Mapping for LUT-Based FPGAs
Mishchenko, A.   Chatterjee, S.   Brayton, R. K.  
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA;

This paper appears in: Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publication Date: Feb. 2007
Volume: 26,  Issue: 2
On page(s): 240-253
Location: Sonoma, CA, USA,
ISSN: 0278-0070
INSPEC Accession Number: 9288666
Digital Object Identifier: 10.1109/TCAD.2006.887925
Current Version Published: 2007-01-22

Abstract
This paper presents several orthogonal improvements to the state-of-the-art lookup table (LUT)-based field-programmable gate array (FPGA) technology mapping. The improvements target the delay and area of technology mapping as well as the runtime and memory requirements. 1) Improved cut enumeration computes all K-feasible cuts, without pruning, for up to seven inputs for the largest Microelectronics Center of North Carolina benchmarks. A new technique for on-the-fly cut dropping reduces, by orders of magnitude, the memory needed to represent cuts for large designs. 2) The notion of cut factorization is introduced, in which one computes a subset of cuts for a node and generates other cuts from that subset as needed. Two cut factorization schemes are presented, and a new algorithm that uses cut factorization for delay-oriented mapping for FPGAs with large LUTs is proposed. 3) Improved area recovery leads to mappings with the area, on average, 6% smaller than the previous best work while preserving the delay optimality when starting from the same optimized netlists. 4) Lossless synthesis accumulates alternative circuit structures seen during logic optimization. Extending the mapper to use structural choices reduces the delay, on average, by 6% and the area by 12%, compared with the previous work, while increasing the runtime 1.6 times. Performing five iterations of mapping with choices reduces the delay by 10% and the area by 19% while increasing the runtime eight times. These improvements, on top of the state-of-the-art methods for LUT mapping, are available in the package ABC

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (513 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved