Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

The Energy-per-Useful-Bit Metric for Evaluating and Optimizing Sensor Network Physical Layers
Ammer, J.   Rabacy, J.  
Dept. of Electr. Eng., Washington Univ., Seattle, WA;

This paper appears in: Sensor and Ad Hoc Communications and Networks, 2006. SECON '06. 2006 3rd Annual IEEE Communications Society on
Publication Date: 28-28 Sept. 2006
Volume: 2,  On page(s): 695-700
Location: Reston, VA,
ISBN: 1-4244-0626-9
INSPEC Accession Number: 9453804
Digital Object Identifier: 10.1109/SAHCN.2006.288533
Current Version Published: 2007-01-22

Abstract
To become truly ubiquitous, sensor network nodes must achieve ultra low power consumption. This paper proposes the energy-per-useful-bit (EPUB) metric for evaluating and comparing sensor network physical layers. EPUB includes the energy consumption of both the transmitter and receiver, and amortizes the energy consumption during the synchronization preamble over the number of data bits in the packet. Using EPUB, we compare six existing sensor network PHYs. Next, we optimize the PHY according to EPUB. We conclude that the EPUB of sensor network PHYs can be reduced by increasing data rate, lowering carrier frequency, and using simple modulation schemes such as OOK to reduce synchronization overhead

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (235 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved