Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Machine Detection of Martian Impact Craters From Digital Topography Data
Bue, B. D.   Stepinski, T. F.  
Dept. of Comput. Sci., Purdue Univ., West Lafayette, IN;

This paper appears in: Geoscience and Remote Sensing, IEEE Transactions on
Publication Date: Jan. 2007
Volume: 45,  Issue: 1
On page(s): 265-274
Location: Edinburgh, UK,
ISSN: 0196-2892
INSPEC Accession Number: 9258198
Digital Object Identifier: 10.1109/TGRS.2006.885402
Current Version Published: 2006-12-26

Abstract
Research on automatic identification of impact craters on Mars and other planetary bodies has concentrated on detecting them from imagery data. We present a novel approach to crater detection that utilizes digital topography data instead of images. Craters are delineated by topographic curvature. Thresholding maps of curvature transforms topographic data into a binary image, from which craters are identified using a combination of segmentation and detection algorithms. We apply our method to a large and technically demanding test site and compare the results to the existing catalog of manually identified craters. Our algorithm finds many small craters not listed in the manual catalog, but it fails to detect heavily degraded craters. A detailed quality assessment of the algorithm is presented. The topography-based crater-detection algorithm offers a relatively simple and ready-to-use tool for identification and characterization of fresh impact craters with an adequate performance for the immediate application to Martian geomorphology

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1229 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved