Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Spectrum Analysis of Digital Magnetic Recording Waveforms
Knoll, Arnold L.  
Honeywell Inc., Electronic Data Processing Division, Waltham, Mass. 02154.;

This paper appears in: Electronic Computers, IEEE Transactions on
Publication Date: Dec. 1967
Volume: EC-16,  Issue: 6
On page(s): 732-743
ISSN: 0367-7508
Digital Object Identifier: 10.1109/PGEC.1967.264720
Current Version Published: 2006-12-26

Abstract
Closed form expressions have been obtained for the power density spectra of signal waveshapes in use for digital magnetic recording. The ``signal'' is the magnetization versus distance profile imposed on the magnetic medium to encode binary ones and zeros. Two general classes of signals are distinguished in terms of neighboring bit-to-bit correlation. Standard recording methods such as saturation NRZ and phase modulation are considered, as well as techniques requiring bias current, such as sinusoidal frequency-shift modulation. The spectra are compared with frequency response curves for the reading head at several recorded bit densities. The more ideal bandwidth characteristics of the newer phase- and frequency-modulation techniques help to explain their improved performance at high bit densities.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1925 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved