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Probabilistic Evaluation of Solutions in Variability-Driven Optimization
Azadeh Davoodi   Vishal Khandelwal   Ankur Srivastava  
Dept. of Electr. & Comput. Eng, Maryland Univ., College Park, MD;

This paper appears in: Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publication Date: Dec. 2006
Volume: 25,  Issue: 12
On page(s): 3010-3016
Location: Sonoma, CA, USA,
ISSN: 0278-0070
INSPEC Accession Number: 9311138
Digital Object Identifier: 10.1109/TCAD.2006.882529
Current Version Published: 2006-11-20

Abstract
Very large-scale integration design optimization requires comparison of different solutions to evaluate superiority of one over the other. Typically, a solution is superior if it has a better associated timing and cost. In the presence of fabrication variability, the timing and cost of a solution become random variables with spatial and functional correlations. Therefore, the evaluation of solutions shall be performed probabilistically to determine the probability that a solution has better cost and timing. In this paper, the authors propose/evaluate three methods for fast and accurate computation of this probability: 1) regular Monte Carlo (MC) simulation (as a basis of comparison); 2) joint probability density function (jpdf) approximation using moment matching; and 3) bound-based conditional-MC simulation. They integrated these methods in a variability-driven leakage optimization framework using dual threshold voltages. Their results show that jpdf approximation is efficient; however, it results in suboptimal solutions due to lower accuracy approximating jpdf

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