Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

A wavelet based mammographic system
Laine, A.   Lewis, M.   Taylor, F.  
Florida Univ., Gainesville, FL;

This paper appears in: Acoustics, Speech, and Signal Processing, 1994. ICASSP-94., 1994 IEEE International Conference on
Publication Date: 19-22 Apr 1994
Volume: v,  On page(s): V/21-V/24 vol.5
Meeting Date: 04/19/1994 - 04/22/1994
Location: Adelaide, SA, Australia
ISBN: 0-7803-1775-0
References Cited: 13
INSPEC Accession Number: 4956886
Digital Object Identifier: 10.1109/ICASSP.1994.389521
Current Version Published: 2002-08-06

Abstract
Mammography's role in the detection of breast cancer at early stages is well known. Although more accurate than other existing techniques, mammography still only finds 80 to 90 percent of breast cancers. It has been suggested that mammograms, as normally viewed, display only about 3% of the total information detected. The general inability to detect small tumors and other salient features within mammograms motivates our investigation of a system we call the Mammogram Display System (MDS). The core technology used for MDS image enhancement is the wavelet transform

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (328 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved