Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Holographic reduced representations
Plate, T.A.  
British Columbia Cancer Res. Centre, Vancouver, BC ;

This paper appears in: Neural Networks, IEEE Transactions on
Publication Date: May 1995
Volume: 6,  Issue: 3
On page(s): 623-641
ISSN: 1045-9227
References Cited: 38
CODEN: ITNNEP
INSPEC Accession Number: 4960403
Digital Object Identifier: 10.1109/72.377968
Current Version Published: 2002-08-06

Abstract
Associative memories are conventionally used to represent data with very simple structure: sets of pairs of vectors. This paper describes a method for representing more complex compositional structure in distributed representations. The method uses circular convolution to associate items, which are represented by vectors. Arbitrary variable bindings, short sequences of various lengths, simple frame-like structures, and reduced representations can be represented in a fixed width vector. These representations are items in their own right and can be used in constructing compositional structures. The noisy reconstructions extracted from convolution memories can be cleaned up by using a separate associative memory that has good reconstructive properties

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1756 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved