Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Wavelets for computer graphics: a primer.1
Stollnitz, E.J.   DeRose, A.D.   Salesin, D.H.  
Dept. of Appl. Math., Washington Univ., Seattle, WA;

This paper appears in: Computer Graphics and Applications, IEEE
Publication Date: May 1995
Volume: 15,  Issue: 3
On page(s): 76-84
ISSN: 0272-1716
References Cited: 16
CODEN: ICGADZ
INSPEC Accession Number: 4952365
Digital Object Identifier: 10.1109/38.376616
Current Version Published: 2002-08-06

Abstract
Wavelets are a mathematical tool for hierarchically decomposing functions. They allow a function to be described in terms of a coarse overall shape, plus details that range from broad to narrow. Regardless of whether the function of interest is an image, a curve, or a surface, wavelets offer an elegant technique for representing the levels of detail present. The article is intended to provide people working in computer graphics with some intuition for what wavelets are, as well as to present the mathematical foundations necessary for studying and using them. We discuss the simple case of Haar wavelets in one and two dimensions, and show how they can be used for image compression

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (656 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved