Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

A supercomputer for neural computation
Asanovic, K.   Beck, J.   Feldman, J.   Morgan, N.   Wawrzynek, J.  
Int. Comput. Sci. Inst., California Univ., Berkeley, CA;

This paper appears in: Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on
Publication Date: 27 Jun-2 Jul 1994
Volume: 1,  On page(s): 5-9 vol.1
Meeting Date: 06/27/1994 - 07/02/1994
Location: Orlando, FL, USA
ISBN: 0-7803-1901-X
References Cited: 10
INSPEC Accession Number: 4903685
Digital Object Identifier: 10.1109/ICNN.1994.374129
Current Version Published: 2002-08-06

Abstract
The requirement to train large neural networks quickly has prompted the design of a new massively parallel supercomputer using custom VLSI. This design features 128 processing nodes, communicating over a mesh network connected directly to the processor chip. Studies show peak performance in the range of 160 billion arithmetic operations per second. This paper presents the case for custom hardware that combines neural network-specific features with a general programmable machine architecture, and briefly describes the design in progress

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (464 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved