Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

The Khoros software development environment for image and signalprocessing
Konstantinides, K.   Rasure, J.R.  
Hewlett-Packard Co., Palo Alto, CA;

This paper appears in: Image Processing, IEEE Transactions on
Publication Date: May 1994
Volume: 3,  Issue: 3
On page(s): 243-252
ISSN: 1057-7149
References Cited: 11
CODEN: IIPRE4
INSPEC Accession Number: 4719600
Digital Object Identifier: 10.1109/83.287018
Current Version Published: 2002-08-06

Abstract
Data flow visual language systems allow users to graphically create a block diagram of their applications and interactively control input, output, and system variables. Khoros is an integrated software development environment for information processing and visualization. It is particularly attractive for image processing because of its rich collection of tools for image and digital signal processing. This paper presents a general overview of Khoros with emphasis on its image processing and DSP tools. Various examples are presented and the future direction of Khoros is discussed

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (968 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved