Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Digital redesign of a continuous controller based on closed loopperformance
Kennedy, R.A.   Evans, R.J.  
Dept. of Syst. Eng., Australian Nat. Univ., Canberra, ACT;

This paper appears in: Decision and Control, 1990., Proceedings of the 29th IEEE Conference on
Publication Date: 5-7 Dec 1990
On page(s): 1898-1901 vol.3
Meeting Date: 12/05/1990 - 12/07/1990
Location: Honolulu, HI, USA
References Cited: 4
INSPEC Accession Number: 4030332
Digital Object Identifier: 10.1109/CDC.1990.203950
Current Version Published: 2002-08-06

Abstract
The authors present a digital controller redesign philosophy which attempts to match the closed-loop performance of a nominal continuous-time controller using a model-following design setting. The requirement of excessive sampling rates necessary with a number of popular existing techniques (e.g. the prewarped bilinear transform redesign) is largely obviated. Sampling rates close to twice the closed-loop bandwidth (Nyquist rate) give good performance with the proposed technique. It is concluded that the proposed model can be used as is for an analog-to-digital redesign which appears to work favorably at low sampling rates, or it can be used as a starting point for further pole-zero placement

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (248 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved