Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Magnetic force scanning tunneling microscope imaging of overwrittendata
Gomez, R.D.   Adly, A.A.   Mayergoyz, I.D.   Burke, E.R.  
Dept. of Electr. Eng., Maryland Univ., College Park, MD;

This paper appears in: Magnetics, IEEE Transactions on
Publication Date: Sep 1992
Volume: 28,  Issue: 5, Part 2
On page(s): 3141-3143
Meeting Date: 04/13/1992 - 04/16/1992
Location: St. Louis, MO, USA
ISSN: 0018-9464
References Cited: 8
CODEN: IEMGAQ
INSPEC Accession Number: 4344246
Digital Object Identifier: 10.1109/20.179738
Current Version Published: 2002-08-06

Abstract
The MFSTM (magnetic force scanning tunneling microscopy) technique is shown to be a powerful technique for generating images of magnetization patterns. Images of the overwritten data on commercial magnetic disks and images of deliberately written patterns which serve as benchmark are presented. The usefulness of this method for probing the subtle effects of insufficient erasure during data overwrite. Results demonstrate that, due to the limitations in the electromechanical positioning of the recording head, overwritten data in longitudinal rigid disk recording systems are not necessarily completely erased. As a result, portions of the old data remain and could be retrieved. In the future, this technique can provide some valuable insights into various mechanisms associated with data overwrite, which include questions about the minimum off-track deviation necessary before the old data can persist

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (420 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved