Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Estimating network internal link loss behavior from end-to-end multi-cast measurements
Ergen, S.C.   Ergen, M.   Varaiya, P.  
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA;

This paper appears in: Wireless Communications and Networking Conference, 2006. WCNC 2006. IEEE
Publication Date: 3-6 April 2006
Volume: 4,  On page(s): 2335-2341
E-ISBN: 1-4244-0270-0
Location: Las Vegas, NV,
ISSN: 1525-3511
ISBN: 1-4244-0269-7
INSPEC Accession Number: 9122389
Digital Object Identifier: 10.1109/WCNC.2006.1696659
Current Version Published: 2006-09-18

Abstract
We study the use of multi-cast probes to infer network internal loss behavior from losses observed in multi-cast receivers. First part of the paper analyzes the estimation problem based on the assumption that there is no temporal correlation between link losses for different probes. We have applied expectation-maximization (EM) algorithm to this problem. We compared the results of EM with a direct approach developed in R. Cacerer et al. (1999). The second part of the paper is based on the assumption of Markov temporal correlation between packet losses. We applied EM algorithm to this problem with E-step approximated by Gibbs sampling, completely factorized variational and structured variational approximation. We observed from simulation that the links closer to observed nodes give more accurate results and that structured variational approximation improves simple variational approximation results considerably

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (238 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved