Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

Word Sense Determination using WordNet and Sense Co-occurrence
Che-Yu Yang   Hung, J.C.  
Dept. of Comput. Sci. & Inf. Eng., Tamkang Univ., Taipei;

This paper appears in: Advanced Information Networking and Applications, 2006. AINA 2006. 20th International Conference on
Publication Date: 18-20 April 2006
Volume: 1,  On page(s): 779-784
Location: Vienna,
ISSN: 1550-445X
ISBN: 0-7695-2466-4
INSPEC Accession Number: 9084787
Digital Object Identifier: 10.1109/AINA.2006.353
Current Version Published: 2006-05-15

Abstract
This paper presents a method of word sense disambiguation that assigns a target word the sense that is most related to the senses of its neighbor words. We explore the use of measures of relatedness between word senses based on a novel hybrid approach. First, we investigate how to "literally" and "regularly" express a ''concept". We apply set algebra to Wordnet's synsets cooperating with Wordnet's word ontology. In this way we establish regular rules for constructing various representations (lexical notations) of a concept using Boolean operators and various word forms in synset(s). Then we construct a formal mechanism for quantifying and estimating the semantic relatedness between concepts-we facilitate "concept distribution statistics" to determine the degree of semantic relatedness between two lexically expressed concepts. Then we applied the measure of semantic relatedness to the WSD task. The experimental results showed good performance on Semcor, a subset of Brown corpus. We observe that measures of semantic relatedness are useful sources of information for word sense disambiguation

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (421 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved